Speaker
Mr
Deyong Duan
(University of Science and Technology of China)
Description
NTD-Ge (Neutron Transmutation Doped Germanium) is one of the crucial components in bolometer systems, boasting a large dynamic response range and high sensitivity. A group of 10N HPGe samples are irradiated by thermal neutrons with different flux at China Advanced Research Reactor. After a half-year cooling down, these samples are fabricated into NTD-Ge sensors hiring the developed technological processes, following as defect characterization evaluation, thermal annealing, surface treatment and point/wrapped around electrode coating, and etc. In addition, a mK cryogenic testing platform is established to study the low-temperature properties of NTD-Ge for the applications in bolometers.
Authors
Mr
Deyong Duan
(University of Science and Technology of China)
Mingxuan XUE
(USTC)
